“Foreign Experts Touring Anhui” group of 8 visited HFUT on the morning of July 25th, warmly received by relevant parties from School of Electronic Science & Applied Physics and Engineering Research Center of Safety-Critical Industry Measurement and Control Technology (Hefei) under Ministry of Education.

At the meeting in School of Electronic Science & Applied Physics, both sides expressed best wishes for the cooperative relationship established and had high hopes on its expanding and flourishing. Adjunct Professor of University of Rochester, Mark A. Indovina, an eminent scholar in micro-electronics visited Advanced Film Lab, Micro-nano Functional Materials and Apparatus Lab, FPGA and Embedded System Lab. He also had interactions with HFUT teachers and students.

Dr. Zac Doerzaph, Director of Center for Automotive Safety Research at Virginia Tech, accompanied by Gao Pengfei, Vice Director of China Association For International Exchange of Personnel, paid a visit to Engineering Research Center of Safety-Critical Industry Measurement and Control Technology (Hefei) under Ministry of Education. He showed great interest and strong intention to cooperate with us after hearing the report of the center’s achievements in auto electronics, electronic controlling system of new energy vehicles and internet of vehicles.

The bi-annual Sino-American Technology and Engineering Conference is co-hosted by State Administration of Foreign Experts Affairs and Chinese Institute of Engineers –USA. 10 sessions have been held since its initiation in 1993. The meeting is aimed to create a platform for engineers from two countries to exchange technology and to solve technical problems of Chinese enterprises. This year’s Sino-American Technology and Engineering Conference on Information Technology & the second stage of “Foreign Experts Touring Anhui” is co-hosted by State Administration of Foreign Experts Affairs and provincial government of Anhui. The visit to HFUT is an in-depth continuation of the investigation conducted in the first stage.